DocumentCode :
1313995
Title :
Test Technology TC Newsletter
Author :
Pande, Prajakt
Author_Institution :
School of Electrical Engineering and Computer Science, Washington State University, Pullman,
Volume :
29
Issue :
4
fYear :
2012
Firstpage :
103
Lastpage :
104
Abstract :
Provides a listing of upcoming events of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2012.2204924
Filename :
6327731
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1313995