• DocumentCode
    1314085
  • Title

    Testing of a low-resistance joint of CICC for Indian tokamak SST-1

  • Author

    Dudarev, A. ; Keilin, V. ; Kruglov, S. ; Nikolaev, A. ; Shcherbakov, V. ; Pradhan, S. ; Saxena, Y.C.

  • Author_Institution
    Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
  • Volume
    10
  • Issue
    1
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    1114
  • Lastpage
    1117
  • Abstract
    In the frame of CICC testing for sc coils of Indian tokamak SST-1 the soldered joint design was developed and tested up to 50 kA in a loop comprising the secondary winding of a sc transformer. The CICC (14.8/spl times/14.8 mm/sup 2/) was manufactured by Hitachi. It consists of 135 (3/spl times/3/spl times/3/spl times/5) Nb-Ti strands each 0.86 mm dia. In the current range from 10 kA to 45 kA the joint resistance remained almost constant (from 3.6 n/spl Omega/ to 4.0 n/spl Omega/) in the bias field of about 2 T. The temperature dependence of CICC quench current during its charging was measured and showed an excellent (98%) coincidence with critical current values of a single strand. The measured temperature increase of CICC was used to evaluate its self-field AC losses at different charging rates (1.3-1.8 kA/s) and then to estimate the transverse resistivity of the cable. Its low value (approximately 8/spl middot/10/sup -10/ /spl Omega//spl middot/m) most likely reflects the fact that the clean surfaces of the strands in the cable are too tightly pressed. This can negatively influence the CICC stability towards pulse electromagnetic disturbances.
  • Keywords
    Tokamak devices; soldering; superconducting cables; superconducting coils; superconducting transformers; 10 to 45 kA; 2 T; CICC testing; Indian tokamak SST-1; Nb-Ti; critical current; pulse electromagnetic disturbance; quench current; self-field AC loss; soldered joint; stability; superconducting coil; superconducting transformer; temperature dependence; transverse resistivity; Coils; Critical current; Current measurement; Electrical resistance measurement; Loss measurement; Manufacturing; Temperature dependence; Temperature measurement; Testing; Tokamaks;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.828428
  • Filename
    828428