DocumentCode :
1314085
Title :
Testing of a low-resistance joint of CICC for Indian tokamak SST-1
Author :
Dudarev, A. ; Keilin, V. ; Kruglov, S. ; Nikolaev, A. ; Shcherbakov, V. ; Pradhan, S. ; Saxena, Y.C.
Author_Institution :
Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
Volume :
10
Issue :
1
fYear :
2000
fDate :
3/1/2000 12:00:00 AM
Firstpage :
1114
Lastpage :
1117
Abstract :
In the frame of CICC testing for sc coils of Indian tokamak SST-1 the soldered joint design was developed and tested up to 50 kA in a loop comprising the secondary winding of a sc transformer. The CICC (14.8/spl times/14.8 mm/sup 2/) was manufactured by Hitachi. It consists of 135 (3/spl times/3/spl times/3/spl times/5) Nb-Ti strands each 0.86 mm dia. In the current range from 10 kA to 45 kA the joint resistance remained almost constant (from 3.6 n/spl Omega/ to 4.0 n/spl Omega/) in the bias field of about 2 T. The temperature dependence of CICC quench current during its charging was measured and showed an excellent (98%) coincidence with critical current values of a single strand. The measured temperature increase of CICC was used to evaluate its self-field AC losses at different charging rates (1.3-1.8 kA/s) and then to estimate the transverse resistivity of the cable. Its low value (approximately 8/spl middot/10/sup -10/ /spl Omega//spl middot/m) most likely reflects the fact that the clean surfaces of the strands in the cable are too tightly pressed. This can negatively influence the CICC stability towards pulse electromagnetic disturbances.
Keywords :
Tokamak devices; soldering; superconducting cables; superconducting coils; superconducting transformers; 10 to 45 kA; 2 T; CICC testing; Indian tokamak SST-1; Nb-Ti; critical current; pulse electromagnetic disturbance; quench current; self-field AC loss; soldered joint; stability; superconducting coil; superconducting transformer; temperature dependence; transverse resistivity; Coils; Critical current; Current measurement; Electrical resistance measurement; Loss measurement; Manufacturing; Temperature dependence; Temperature measurement; Testing; Tokamaks;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.828428
Filename :
828428
Link To Document :
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