DocumentCode
1314113
Title
Preparation of nickel substrates for coated conductors
Author
Truchan, T.G. ; Rountree, F.H. ; Lanagan, M.T. ; McClellan, S.M. ; Miller, D.J. ; Goretta, K.C. ; Tomsic, Michael ; Foley, R.
Author_Institution
Argonne Nat. Lab., IL, USA
Volume
10
Issue
1
fYear
2000
fDate
3/1/2000 12:00:00 AM
Firstpage
1130
Lastpage
1133
Abstract
Polycrystalline Ni has been used as a substrate for high-current, coated YBa/sub 2/Cu/sub 3/O/sub x/ superconductors. For many conductors, Ni is rolled to large deformation and annealed to produce a cube texture. In this study, Ni was rolled to >95% reduction and annealed in 5% H/sub 2//95% He at 300-1000/spl deg/C for various times. The resulting substrates were examined by scanning electron microscopy, X-ray and electron diffraction, and surface interferometry. Key determinations for the Ni were extent of in-plane and out-of-plane texture, surface smoothness, and grain size. The extent of texture was approximately independent of annealing temperature and increased slightly with annealing time. Annealing at temperatures >600/spl deg/C increased surface roughness, primarily due to grain-boundary grooving. Grain growth was fastest at 1000/spl deg/C and was proportional to time to the 0.1 power.
Keywords
annealing; barium compounds; electron diffraction; grain growth; grain size; high-temperature superconductors; nickel; rough surfaces; scanning electron microscopy; substrates; surface topography; texture; yttrium compounds; 300 to 1000 degC; Ni; X-ray diffraction; YBa/sub 2/Cu/sub 3/O; YBa/sub 2/Cu/sub 3/O/sub x/ superconductors; annealing temperature; annealing time; coated conductors; cube texture; deformation; electron diffraction; grain growth; grain size; grain-boundary grooving; in-plane texture; nickel substrates; out-of-plane texture; preparation; scanning electron microscopy; surface interferometry; surface roughness; surface smoothness; Annealing; Conductors; Nickel; Rough surfaces; Scanning electron microscopy; Superconductivity; Surface roughness; Temperature; X-ray diffraction;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.828432
Filename
828432
Link To Document