• DocumentCode
    1314315
  • Title

    Time constant measurement (decay of coupling currents) in high T/sub c/ tapes

  • Author

    Krempasky, L. ; Schmidt, Christoph

  • Author_Institution
    Inst. of Electr. Eng., Slovak Acad. of Sci., Bratislava, Slovakia
  • Volume
    10
  • Issue
    1
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    1251
  • Lastpage
    1254
  • Abstract
    Coupling currents in high T/sub c/ Bi-2223 tapes were induced by a fast change of an external magnetic field. The measurements were performed using exponential field decays and half cycle sinusoidal excitation fields. The induced coupling currents, decaying after the end of the field variation, are detected using a pick-up coil surrounding the sample and a compensation coil. The measurements were performed at 77 K in perpendicular external field. An increase of the measured time constant /spl tau/ with the amplitude of external field variation was found. A theory presented recently based on a slab model describes the measured voltage traces reasonably well, if an average effective permeability /spl mu//sub ef/ is used as a fit parameter. It approaches unity for large external field amplitudes. /spl tau///spl mu//sub ef/ was found to be constant as expected. Time constants deduced from ac-loss measurements in the low frequency range are in good agreement with the directly measured values.
  • Keywords
    bismuth compounds; calcium compounds; high-temperature superconductors; strontium compounds; superconducting tapes; 77 K; AC loss; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O; compensation coil; coupling current decay; effective permeability; high T/sub c/ Bi-2223 tape; magnetic field; pick-up coil; slab model; time constant measurement; Coils; Couplings; Current measurement; Frequency measurement; Magnetic field measurement; Performance evaluation; Permeability measurement; Slabs; Time measurement; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.828462
  • Filename
    828462