Title :
Using partial isolation rings to test core-based designs
Author :
Touba, Nur A. ; Pouya, Bahram
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
A partial isolation ring provides the same fault coverage as a full isolation ring but avoids adding multiplexers on critical timing paths and reduces area overhead. The authors examine several partial isolation ring selection strategies that vary in computational complexity
Keywords :
computer testing; isolation technology; magnetic core stores; computational complexity; core-based designs; critical timing paths; partial isolation rings; test; Compaction; Computational complexity; Controllability; Feeds; Flip-flops; Inverters; Logic testing; Multiplexing; Observability; Timing;
Journal_Title :
Design & Test of Computers, IEEE
