DocumentCode
1314954
Title
IR photodetector with exclusion effect and self-filtering n+ layer
Author
Djuric, Z. ; Jovic, V. ; Matic, M. ; Jaksic, Zoran
Author_Institution
Inst. of Microelectron. Technol. & Single Crystals, Beograd, Yugoslavia
Volume
26
Issue
13
fYear
1990
fDate
6/21/1990 12:00:00 AM
Firstpage
929
Lastpage
931
Abstract
A ´vertical´ exclusion homoepitaxial n+n structure for infrared photodetectors in nonequilibrium with certain advantages when comparison with ´horizontal´ n+n structures is proposed. The exclusion effect was observed at 220 K in experimental InSb n+n structures fabricated by liquid phase epitaxy. It was not possible to utilised the benefits of the suppression of Auger recombination because of the low Shockley-Read lifetime in the substrate.
Keywords
III-V semiconductors; indium antimonide; infrared detectors; photodetectors; semiconductor technology; 220 K; IR photodetector; InSb; LPE; Shockley-Read lifetime; exclusion effect; exclusion homoepitaxial n +n structure; liquid phase epitaxy; self-filtering n + layer; semiconductors; suppression of Auger recombination; vertical structures;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900607
Filename
82855
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