DocumentCode :
1314985
Title :
Cell-level placement for improving substrate thermal distribution
Author :
Tsai, Ching-Han ; Kang, Sung-Mo
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
19
Issue :
2
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
253
Lastpage :
266
Abstract :
The dramatic increase of power consumption in very large scale integration circuits has led to high operating temperature and large thermal gradient, thereby resulting in serious timing and reliability concerns. Temperature-tracking is thus becoming of paramount importance in modern electronic design automation (EDA) tools. In this paper we present two thermal placement tools for standard cell and macro cell design styles respectively. They are aimed at reducing hot spots in a design without compromising traditional design metrics such as area and wire length. We developed a compact substrate thermal model that can be used by the placer to calculate the temperature profile of a placement efficiently, or to convert the user-specified temperature constraint into the corresponding power distribution constraint as an alternative placement objective. As a result, our method is much more efficient than directly employing temperature profile simulation during the placement process. The simulation results show noticeable improvement of thermal distribution over the traditional placement algorithm, with little impact on area and wire length of the final layout
Keywords :
VLSI; circuit layout CAD; integrated circuit layout; integrated circuit modelling; integrated circuit reliability; matrix algebra; substrates; temperature distribution; thermal analysis; thermal resistance; timing; EDA tools; VLSI circuits; cell-level placement; compact substrate thermal model; electronic design automation tools; hot spots reduction; macro cell design style; power consumption; power distribution constraint; reliability; standard cell design style; substrate thermal distribution; temperature profile; temperature-tracking; thermal gradient; thermal placement tools; timing; user-specified temperature constraint; very large scale integration; Electronic design automation and methodology; Energy consumption; Integrated circuit reliability; Microprocessors; Semiconductor device packaging; Temperature distribution; Thermal resistance; Timing; Very large scale integration; Wire;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.828554
Filename :
828554
Link To Document :
بازگشت