Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions

This paper presents charts for optimum accelerated life-test plans for estimating a simple linear relationship between an accelerating stress and product life, which has a Weibull or smallest extreme value distribution, when the data are to be analyzed before all tests units fail. The plans show that one need not run all test units to failure and that more units ought to be tested at low test stresses than at high ones. The plans are illustrated with a voltage-accelerated life test of an electrical insulating fluid.