DocumentCode
1315457
Title
A Current-Feedback Instrumentation Amplifier With a Gain Error Reduction Loop and 0.06% Untrimmed Gain Error
Author
Wu, Rong ; Huijsing, Johan H. ; Makinwa, Kofi A A
Author_Institution
Electron. Instrum. Lab., Delft Univ. of Technol., Delft, Netherlands
Volume
46
Issue
12
fYear
2011
Firstpage
2794
Lastpage
2806
Abstract
This paper presents a power-efficient current-feedback instrumentation amplifier (CFIA) with high gain accuracy. It is intended for interfacing precision bridge transducers and thermocouples that output mV-level signals. The gain accuracy of the CFIA is mainly limited by the mismatch of two transconductors. Applying dynamic element matching (DEM) to them ensures good gain accuracy, gain drift, and linearity. As a result, these transconductors can be implemented as simple differential pairs, resulting in significantly improved power efficiency when compared with the use of resistor-degenerated stages. To suppress the output ripple caused by DEM, an automatic gain error reduction loop dynamically nulls the Gm mismatch of the input and feedback transconductors, thus eliminating the need for trimming. The prototype chip was realized in a 0.7-μm CMOS process. Measurement results show a maximum 0.06% untrimmed gain error and a 5-ppm INL at a gain of 100. This work also achieves an NEF of 11.2, a maximum input-referred offset of 3 μV, and a CMRR of 127 dB while consuming only 290 μA at a 5-V supply.
Keywords
CMOS analogue integrated circuits; feedback amplifiers; instrumentation amplifiers; thermocouples; transducers; CMOS process; DEM; automatic gain error reduction loop; current 290 muA; dynamic element matching; feedback transconductor mismatch; gain 127 dB; interfacing precision bridge transducer; maximum input-referred offset; output mV-level signal; output ripple suppression; power-efficient CFIA; power-efficient current-feedback instrumentation amplifier; resistor-degenerated stage; size 0.17 mum; thermocouple; untrimmed gain error; voltage 3 muV; voltage 5 V; Current measurement; Feedback control; Gain control; Noise measurement; Resistors; Transconductance; $1/f$ noise; Chopping; current-feedback; dynamic element matching; gain accuracy; gain drift; gain error; linearity; mismatch; noise efficiency factor (NEF); offset; ripple reduction loop;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2011.2162923
Filename
6011665
Link To Document