Title :
Measuring the Value of RFID Investment: Focusing on RFID Budget Allocation
Author :
Lee, In ; Lee, Byoung-Chan
Author_Institution :
Sch. of Comput. Sci., Western Illinois Univ., Macomb, IL, USA
Abstract :
Despite the current challenges and risks in implementation, radio frequency identification (RFID) technology is rapidly expanding its application area from simple inventory management to advanced location tracking and supply chain management in a wide range of industries. As RFID technology is widely adopted in the industries, the valuation of RFID investment has become vital for businesses due to its potential impacts on cost, operational efficiency, and customer satisfaction. Because of the lack of analytical methods for measuring the benefits and costs, our study attempts to develop a mathematical approach to the valuation of RFID investment. This study presents the base model for RFID investment decisions in a supply chain management setting and enhances the model to help make budget allocation decisions for businesses with multiple sites under budgetary constraints. Our model provides a basis for our understanding of RFID value creation and ways to build an RFID business case for an RFID investment justification.
Keywords :
cost-benefit analysis; decision making; inventory management; investment; mathematical analysis; radiofrequency identification; risk management; supply chain management; RFID budget allocation; RFID business case; RFID investment decision model; RFID investment value measurement; RFID technology; advanced location tracking; budgetary constraints; cost-benefit analysis; customer satisfaction; inventory management; mathematical approach; operational efficiency; radio frequency identification technology implementation risks; supply chain management setting; Analytical models; Investments; Mathematical model; Radiofrequency identification; Resource management; Supply chains; Analytical method; budget allocation; investment justification; radio frequency identification (RFID); valuation;
Journal_Title :
Engineering Management, IEEE Transactions on
DOI :
10.1109/TEM.2011.2163072