Title :
Long-Term Life-Tests of Industrial Power Thyristors (SCR´s) Over 50 000 Hours
Author :
Schwickardi, Gerhard G.
Author_Institution :
2 Bachtelstrasse//CH-5430 Wettingen//SWITZERLAND
fDate :
6/1/1976 12:00:00 AM
Abstract :
This thesis presents typical results of a long-term life-test on P-N-P-N power thyristors with diffused alloyed junctions. Devices are tested under thermal cycle operating conditions for 6 years (50 000 hours) real time. Degradation and catastrophic failures are discussed. Electrical phenomena are correlated with failure rates.
Keywords :
Circuit testing; Electric variables measurement; Firing; Hysteresis; Manufacturing; Temperature distribution; Thermal degradation; Thermal resistance; Thyristors; Voltage; Life test; SCR; Thyristor;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5215004
