Title :
Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]
Author :
Pasquini, A. ; Crespo, A.N. ; Matrella, P.
Author_Institution :
ENEA, Rome, Italy
fDate :
12/1/1996 12:00:00 AM
Abstract :
This paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP); and 2) the relation between this sensitivity and the testing accuracy for computer software. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models. Measurement and comparison are repeated for various OPs, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP; and 2) this relation depends on the accuracy with which the software system has been tested
Keywords :
program testing; reliability theory; sensitivity analysis; software reliability; computer software; model sensitivity; operational profile; predictive accuracy; software reliability-growth; testing accuracy; Application software; Computer errors; Predictive models; Software measurement; Software performance; Software reliability; Software systems; Software testing; Solid modeling; System testing;
Journal_Title :
Reliability, IEEE Transactions on