DocumentCode :
1315839
Title :
Monolayer Be delta -doped heterostructure bipolar transistor fabricated using doping selective base contact
Author :
Kuo, T.Y. ; Cunningham, J.E. ; Goossen, K.W. ; Jan, W.Y. ; Fonstad, C.G. ; Ren, F.
Author_Institution :
AT&T Labs., Holmdel, NJ, USA
Volume :
26
Issue :
15
fYear :
1990
fDate :
7/19/1990 12:00:00 AM
Firstpage :
1187
Lastpage :
1188
Abstract :
A heterostructure bipolar transistor (HBT) with a base delta -doping of 6*1014 cm-2, near the physical limit of one monolayer (ML) is reported. The devices exhibits a current gain of 15. The doping confinement of the delta layer is 15 AA. To fabricate the HBT without inducing dopant diffusion or using sensitive etching, a new low-temperature base-contacting procedure (Tmax=420 degrees C) which requires no base-emitter etching has been developed. This has the additional benefits of greatly reducing surface recombination and yielding a planar structure.
Keywords :
beryllium; heterojunction bipolar transistors; semiconductor doping; 15 AA; 420 C; GaAs:Be; HBT; current gain; delta -doped; doping confinement; doping selective base contact; heterostructure bipolar transistor; high-base doping; low-temperature base-contacting procedure; monolayer; planar structure; reducing surface recombination;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900768
Filename :
82938
Link To Document :
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