Title :
Monolayer Be delta -doped heterostructure bipolar transistor fabricated using doping selective base contact
Author :
Kuo, T.Y. ; Cunningham, J.E. ; Goossen, K.W. ; Jan, W.Y. ; Fonstad, C.G. ; Ren, F.
Author_Institution :
AT&T Labs., Holmdel, NJ, USA
fDate :
7/19/1990 12:00:00 AM
Abstract :
A heterostructure bipolar transistor (HBT) with a base delta -doping of 6*1014 cm-2, near the physical limit of one monolayer (ML) is reported. The devices exhibits a current gain of 15. The doping confinement of the delta layer is 15 AA. To fabricate the HBT without inducing dopant diffusion or using sensitive etching, a new low-temperature base-contacting procedure (Tmax=420 degrees C) which requires no base-emitter etching has been developed. This has the additional benefits of greatly reducing surface recombination and yielding a planar structure.
Keywords :
beryllium; heterojunction bipolar transistors; semiconductor doping; 15 AA; 420 C; GaAs:Be; HBT; current gain; delta -doped; doping confinement; doping selective base contact; heterostructure bipolar transistor; high-base doping; low-temperature base-contacting procedure; monolayer; planar structure; reducing surface recombination;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900768