DocumentCode
1315886
Title
A Bayes nonparametric framework for software-reliability analysis
Author
El-Aroui, Mhamed-Ali ; Soler, Jean-Louis
Author_Institution
IMAG, Grenoble, France
Volume
45
Issue
4
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
652
Lastpage
660
Abstract
This paper presents a Bayes nonparametric approach for tracking and predicting software reliability. We use the common assumptions on the software operational environment to get a stochastic model where the successive times between software failures are exponentially distributed; their failure rates have Markov priors. Under these general assumptions we give Bayes estimates of the parameters that assess and predict the software reliability. We give algorithms (based on Monte-Carlo methods) to compute these Bayes estimates. Our approach allows the reliability analyst to construct a personal software reliability model simply by specifying the available prior knowledge; afterwards the results in this paper can be used to get Bayes estimates of the useful reliability parameters. Examples of possible prior physical knowledge concerning the software testing and correction environments are given. The maximum-entropy principle is used to translate this knowledge to prior distributions on the failure-rate process. Our approach is used to study some simulated and real failure data sets
Keywords
Bayes methods; Markov processes; Monte Carlo methods; exponential distribution; inference mechanisms; maximum entropy methods; nonparametric statistics; program testing; software reliability; Bayes nonparametric framework; Gibbs sampling; Monte-Carlo methods; correction environments; exponential distribution; failure data sets; failure-rate process; maximum-entropy principle; personal software reliability model; software operational environment; software reliability prediction; software reliability tracking; software testing; software-reliability analysis; stochastic model; times between software failures; Artificial intelligence; Failure analysis; Performance evaluation; Predictive models; Software reliability; Software systems; Software testing; Stochastic processes; System testing; Uncertainty;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.556589
Filename
556589
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