DocumentCode
1315921
Title
Some Reliability Relations for Mixed Populations and Failure Modes
Author
Nicholson, B.J.
Author_Institution
System Products Division//IBM//Essex Junction, VT 05452 USA
Issue
3
fYear
1976
Firstpage
211
Lastpage
212
Abstract
Expressions for various reliability measures are given for competing failure modes, mixtures of s-independent populations and the stochastic combination of the two cases.
Keywords
Assembly; Capacitors; Erbium; Hazards; Integrated circuit measurements; Integrated circuit reliability; Printed circuits; Reliability engineering; Resistors; Stochastic processes; Failure rate; Mixed populations;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1976.5215045
Filename
5215045
Link To Document