Title :
Bayesian Limits for the Reliability of Pass/Fail Parallel Units
Author :
Smith, Donald R. ; Springer, Melvin D.
Author_Institution :
Department of Industrial Engineering//Texas A & M University//College Station, Texas 77840 USA
Abstract :
This paper employs the Mellin transform to derive the exact posterior pdf and Cdf of the reliability of a system consisting of s-independent units in parallel, based on pass-fail data obtained from testing the units. From a tabulation of the posterior Cdf, arbitrary Bayesian limits can be obtained for the reliability of the parallel system. A computer program for determining the requisite posterior pdf and Cdf is operational.
Keywords :
Bayesian methods; Chebyshev approximation; Concurrent computing; Costs; Operating systems; Polynomials; Reliability; Statistical analysis; Statistics; System testing; Bayesian limits; Mellin transform; Parallel systems; System reliability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5215047
