DocumentCode :
1316086
Title :
Cellular automata-based built-in self-test structures for VLSI systems
Author :
Tsalides, Ph
Author_Institution :
Dept. of Electr. Eng., Democritus Univ. of Thrace, Xanthi, Greece
Volume :
26
Issue :
17
fYear :
1990
Firstpage :
1350
Lastpage :
1352
Abstract :
Some of the fundamental algebraic properties of hybrid additive, null-bounded, cellular automata (HACA) are presented. Simple HACA have been obtained by spatially alternating additive rules 90 and 150 (in Wolfram´s notation). The use of such HACA for on-chip pseudorandom test pattern generation is also described. The great advantage of HACA over linear feedback shift registers (LFSR), as their size increases, is the fact that HACA display locality and topological regularity, important attributes for VLSI implementation.
Keywords :
VLSI; automatic testing; finite automata; integrated circuit testing; HACA; VLSI systems; Wolfram´s notation; algebraic properties; built-in self-test structures; cellular automata; hybrid additive; linear feedback shift registers; locality; null-bounded; on-chip pseudorandom test pattern generation; topological regularity;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900869
Filename :
82978
Link To Document :
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