DocumentCode
1316171
Title
How easy is matching 2D line models using local search?
Author
Beveridge, J. Ross ; Riseman, Edward M.
Author_Institution
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
Volume
19
Issue
6
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
564
Lastpage
579
Abstract
Local search is a well established and highly effective method for solving complex combinatorial optimization problems. Here, local search is adapted to solve difficult geometric matching problems. Matching is posed as the problem of finding the optimal many-to-many correspondence mapping between a line segment model and image line segments. Image data is assumed to be fragmented, noisy, and cluttered. The algorithms presented have been used for robot navigation, photo interpretation, and scene understanding. This paper explores how local search performs as model complexity increases, image clutter increases, and additional model instances are added to the image data. Expected run-times to find optimal matches with 95 percent confidence are determined for 48 distinct problems involving six models. Nonlinear regression is used to estimate run-time growth as a function of problem size. Both polynomial and exponential growth models are fit to the run-time data. For problems with random clutter, the polynomial model fits better and growth is comparable to that for tree search. For problems involving symmetric models and multiple model instances, where tree search is exponential, the polynomial growth model is superior to the exponential growth model for one search algorithm and comparable for another
Keywords
computational complexity; edge detection; geometry; noise; optimisation; search problems; statistical analysis; 2D line model matching; complex combinatorial optimization problems; exponential growth models; fragmented noisy cluttered data; geometric matching problems; image line segments; line segment model; local search; model complexity; nonlinear regression; optimal many-to-many correspondence mapping; photo interpretation; polynomial growth models; robot navigation; scene understanding; Image segmentation; Layout; Navigation; Object recognition; Optimal matching; Optimization methods; Orbital robotics; Polynomials; Robots; Runtime;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.601245
Filename
601245
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