DocumentCode :
1316200
Title :
Automatic production of the pseudo-circuit Boolean for the failure bounds analogue diagnosis scheme
Author :
Garrett, C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
Volume :
26
Issue :
17
fYear :
1990
Firstpage :
1377
Lastpage :
1378
Abstract :
A basic for partial automation of the failure bounds analogue diagnosis method is given by Wu and Wu. An extension to their work which enables the complete pseudo-circuit to be simulated using any commercial simulator (in this case SPICE) is described. The pseudo-circuit is formed in such a way as to require only a simple comparison to produce the intermediate Boolean diagnosis state vector, prior to use within the failure bounds decision algorithm.
Keywords :
circuit analysis computing; simulation; SPICE; automatic test program generation; failure bounds analogue diagnosis method; failure bounds analogue diagnosis scheme; pseudo circuit Boolean production;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900885
Filename :
82994
Link To Document :
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