DocumentCode :
1316221
Title :
An integrated model for evaluating the amount of data required for reliable recognition
Author :
Lindenbaum, Michael
Author_Institution :
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
Volume :
19
Issue :
11
fYear :
1997
fDate :
11/1/1997 12:00:00 AM
Firstpage :
1251
Lastpage :
1264
Abstract :
Many recognition procedures rely on the consistency of a subset of data features with a hypothesis as the sufficient evidence to the presence of the corresponding object. We analyze here the performance of such procedures, using a probabilistic model, and provide expressions for the sufficient size of such data subsets, that, if consistent, guarantee the validity of the hypotheses with arbitrary confidence. We focus on 2D objects and the affine transformation class, and provide, for the first time, an integrated model which takes into account the shape of the objects involved, the accuracy of the data collected, the clutter present in the scene, the class of the transformations involved, the accuracy of the localization, and the confidence we would like to have in our hypotheses. Increasingly, it turns out that most of these factors can be quantified cumulatively by one parameter, denoted “effective similarity”, which largely determines the sufficient subset size. The analysis is based on representing the class of instances corresponding to a model object and a group of transformations, as members of a metric space, and quantifying the variation of the instances by a metric cover
Keywords :
image recognition; object recognition; probability; 2D objects; affine transformation class; clutter; data features; data requirement; effective similarity; image recognition; integrated model; localization accuracy; object recognition; reliable recognition; Computer vision; Image edge detection; Image recognition; Layout; Libraries; Noise measurement; Object recognition; Performance analysis; Shape measurement; Testing;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.632984
Filename :
632984
Link To Document :
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