Title :
The Type I Extreme-Value Distribution in Reliability
Author :
Canfield, Ronald V.
Author_Institution :
Dept. of Applied Statistics//Utah State University//Logan, Utah 84321 USA
Keywords :
Exponential distribution; Fatigue; Probability distribution; Statistical distributions; Tail;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1975.5215177
