• DocumentCode
    1316965
  • Title

    Reliability of Nondeteriorating Devices

  • Author

    Caldarola, L.

  • Author_Institution
    ``Institut fur Angewandte System-technik und Reaktorphysik´´´´ in Karlsruhe on safety and reliability problems.
  • Issue
    3
  • fYear
    1974
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    A general theory has been developed for calculating the reliability of a device which does not deteriorate with time and which is exposed to a stochastic load. Two important cases of stochastic loads have been considered: (1) statistically independent random pulses, and (2) a sequence of random pulses, each one separated from the next one by a random period of time during which no load is applied to the device. Numerical examples are included.
  • Keywords
    Acquired immune deficiency syndrome; Circuits; Degradation; Reliability engineering; Reliability theory; Space vector pulse width modulation; Stochastic processes; Stress; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1974.5215248
  • Filename
    5215248
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1316965