Title :
Fault-tree Analysis
Author :
Phibbs, Elmer ; Kuwamoto, S. Henry
Author_Institution :
15,522 Eliot Circle, Huntington Beach, Calif. 92647
Keywords :
Algebra; Art; Automatic logic units; Carbon capture and storage; Classification tree analysis; Failure analysis; Fault trees; Logic gates; Minimization methods;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215269
