Title :
Combining Drift and Catastrophic Failure Modes
Author :
Nakagawa, Toshio ; Osaki, Shunji
Author_Institution :
Department of Mathematics, Meijo University, Magoya 468, Japan
Abstract :
A failure model with degradation and catastrophic modes is briefly discussed and some general equations are shown.
Keywords :
Degradation; Digital control; Electric shock; Helium; Inductors; Nuclear electronics; Physics; Random variables; Stress; Telecommunication computing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215273
