• DocumentCode
    1317232
  • Title

    Random k-Labelsets for Multilabel Classification

  • Author

    Tsoumakas, Grigorios ; Katakis, Ioannis ; Vlahavas, Ioannis

  • Author_Institution
    Dept. of Inf., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
  • Volume
    23
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    1079
  • Lastpage
    1089
  • Abstract
    A simple yet effective multilabel learning method, called label powerset (LP), considers each distinct combination of labels that exist in the training set as a different class value of a single-label classification task. The computational efficiency and predictive performance of LP is challenged by application domains with large number of labels and training examples. In these cases, the number of classes may become very large and at the same time many classes are associated with very few training examples. To deal with these problems, this paper proposes breaking the initial set of labels into a number of small random subsets, called labelsets and employing LP to train a corresponding classifier. The labelsets can be either disjoint or overlapping depending on which of two strategies is used to construct them. The proposed method is called RAkEL (RAndom k labELsets), where k is a parameter that specifies the size of the subsets. Empirical evidence indicates that RAkEL manages to improve substantially over LP, especially in domains with large number of labels and exhibits competitive performance against other high-performing multilabel learning methods.
  • Keywords
    pattern classification; RAkEL; computational efficiency; label powerset; multilabel classification; multilabel learning method; predictive performance; random k-labelsets; Classification; Complexity theory; Decision trees; Learning systems; Prediction algorithms; Predictive models; Categorization; classification.; ensembles; labelset; multilabel;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2010.164
  • Filename
    5567103