DocumentCode :
1317295
Title :
Kernel Optimization in Discriminant Analysis
Author :
You, Di ; Hamsici, Onur C. ; Martinez, Aleix M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
33
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
631
Lastpage :
638
Abstract :
Kernel mapping is one of the most used approaches to intrinsically derive nonlinear classifiers. The idea is to use a kernel function which maps the original nonlinearly separable problem to a space of intrinsically larger dimensionality where the classes are linearly separable. A major problem in the design of kernel methods is to find the kernel parameters that make the problem linear in the mapped representation. This paper derives the first criterion that specifically aims to find a kernel representation where the Bayes classifier becomes linear. We illustrate how this result can be successfully applied in several kernel discriminant analysis algorithms. Experimental results, using a large number of databases and classifiers, demonstrate the utility of the proposed approach. The paper also shows (theoretically and experimentally) that a kernel version of Subclass Discriminant Analysis yields the highest recognition rates.
Keywords :
Bayes methods; computer vision; feature extraction; optimisation; pattern classification; Bayes classifier; feature extraction; kernel discriminant analysis; kernel function; kernel mapping; kernel optimization; mapped representation; nonlinear classifiers; Accuracy; Covariance matrix; Eigenvalues and eigenfunctions; Gaussian distribution; Kernel; Measurement; Training; Kernel functions; discriminant analysis; face recognition; feature extraction; kernel optimization; machine learning.; nonlinear classifiers; object recognition; pattern recognition; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Databases, Factual; Discriminant Analysis; Fractals; Image Interpretation, Computer-Assisted; Models, Statistical; Nonlinear Dynamics; Pattern Recognition, Automated; Software;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2010.173
Filename :
5567113
Link To Document :
بازگشت