Title :
Integrated packaging of over 100 GHz bandwidth uni-traveling-carrier photodiodes
Author :
Royter, Yakov ; Furuta, Tomofumi ; Ksdama, S. ; Sahri, Nabil ; Nagatsuma, Tadao ; Ishibashi, Tadao
Author_Institution :
NTT Telecommun. Energy Labs., Kanagawa, Japan
fDate :
4/1/2000 12:00:00 AM
Abstract :
Hybrid packaging techniques, in which the device substrate is different from the package substrate, and wire bonding or solder interconnections are used, are inadequate for ultrahigh-speed (>100 GHz) wideband applications. By employing wafer-bonding techniques, an integrated packaging (IP) technology was developed, in which devices are fabricated directly on the package substrate, and the interconnections are made as a part of the device fabrication process. This IP process was used to fabricate uni-traveling-carrier photodiodes (UTC-PD´s) integrated with millimeter-wave coplanar waveguides (CPW) on package compatible sapphire with high yield. The performance of wafer-bonded UTC-PD´s with 3-dB bandwidth of 102 GHz was similar to that of conventional devices, and the CPW´s exhibited low dispersion.
Keywords :
coplanar waveguides; photodiodes; sapphire; semiconductor device packaging; wafer bonding; 102 GHz; Al/sub 2/O/sub 3/; MM-wave coplanar waveguides; integrated packaging; millimeter-wave CPW; package compatible sapphire; package substrate; ultrahigh-speed applications; uni-traveling-carrier photodiodes; wafer-bonding techniques; wideband applications; Bandwidth; Electronics packaging; Epitaxial layers; Fabrication; Indium phosphide; Millimeter wave technology; Photodiodes; Semiconductor device packaging; Substrates; Wafer bonding;
Journal_Title :
Electron Device Letters, IEEE