• DocumentCode
    1317672
  • Title

    Stochastic Polynomial-Chaos-Based Average Modeling of Power Electronic Systems

  • Author

    Su, Qianli ; Strunz, Kai

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
  • Volume
    26
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    1167
  • Lastpage
    1171
  • Abstract
    With the introduction of variable-frequency generators in next-generation more-electric aircraft, both voltage and frequency are to reveal significant tolerance levels. In this study, a method based on the combination of polynomial chaos and nodal analysis is developed to identify and quantify the impact of such tolerance in ac/dc diode rectifiers and dc/dc switch-mode converters. The resulting stochastic average models track the transients of the tolerance limits and related information in the time domain both accurately and efficiently. The relative merits of the method are substantiated through a comparative analysis with the Monte Carlo and root-sum-square methods.
  • Keywords
    DC-DC power convertors; Monte Carlo methods; aircraft power systems; diodes; electric generators; polynomials; power electronics; rectifying circuits; stochastic processes; switching convertors; time-domain analysis; AC-DC diode rectifier; DC-DC switch-mode converter; Monte Carlo method; comparative analysis; next-generation more-electric aircraft; nodal analysis; power electronic system; root-sum-square method; stochastic polynomial-chaos-based average modeling; time domain analysis; variable-frequency generator; Chaos; Computational modeling; Integrated circuit modeling; Load modeling; Mathematical model; Polynomials; Stochastic processes; Average models; Galerkin method; modeling; more-electric aircraft; network analysis; nodal analysis; polynomial chaos (PC); power electronics; tolerance analysis;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2010.2074215
  • Filename
    5567167