DocumentCode
1317990
Title
N-Type Porous Silicon Substrates for Integrated RF Inductors
Author
Capelle, Marie ; Billoué, Jérôme ; Poveda, Patrick ; Gautier, Gaël
Author_Institution
Lab. de Microelectron. de Puissance, Tours, France
Volume
58
Issue
11
fYear
2011
Firstpage
4111
Lastpage
4114
Abstract
To study the effect of various n-type substrates on high-frequency inductor performances, several devices were integrated on porous silicon (PS), silicon (Si), and glass. Both n-type mesoporous Si and mesoporous/macroporous Si bilayers were fabricated. The analysis further shows that PS reduces significantly the substrate losses. Indeed, higher quality factors have been obtained for the inductors integrated on PS than on the Si substrate and particularly in the case of bilayer structures. These original results can be added to p-type PS performances already shown in the literature. Then, this work demonstrates that PS can also be a promising candidate for the integration of passive and active devices on n-type silicon.
Keywords
Q-factor; anodisation; inductors; porous semiconductors; silicon; N-type porous silicon substrates; Si; anodisation; bilayer structures; integrated RF inductors; n-type mesoporous silicon; quality factors; Glass; Inductors; Mesoporous materials; Q factor; Radio frequency; Silicon; Substrates; Electrochemical etching; on-chip inductor; porous silicon (PS); quality factor; radio frequency (RF);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2164078
Filename
6016229
Link To Document