• DocumentCode
    1317990
  • Title

    N-Type Porous Silicon Substrates for Integrated RF Inductors

  • Author

    Capelle, Marie ; Billoué, Jérôme ; Poveda, Patrick ; Gautier, Gaël

  • Author_Institution
    Lab. de Microelectron. de Puissance, Tours, France
  • Volume
    58
  • Issue
    11
  • fYear
    2011
  • Firstpage
    4111
  • Lastpage
    4114
  • Abstract
    To study the effect of various n-type substrates on high-frequency inductor performances, several devices were integrated on porous silicon (PS), silicon (Si), and glass. Both n-type mesoporous Si and mesoporous/macroporous Si bilayers were fabricated. The analysis further shows that PS reduces significantly the substrate losses. Indeed, higher quality factors have been obtained for the inductors integrated on PS than on the Si substrate and particularly in the case of bilayer structures. These original results can be added to p-type PS performances already shown in the literature. Then, this work demonstrates that PS can also be a promising candidate for the integration of passive and active devices on n-type silicon.
  • Keywords
    Q-factor; anodisation; inductors; porous semiconductors; silicon; N-type porous silicon substrates; Si; anodisation; bilayer structures; integrated RF inductors; n-type mesoporous silicon; quality factors; Glass; Inductors; Mesoporous materials; Q factor; Radio frequency; Silicon; Substrates; Electrochemical etching; on-chip inductor; porous silicon (PS); quality factor; radio frequency (RF);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2164078
  • Filename
    6016229