DocumentCode
1318417
Title
Improvement of Epitaxy GaN Quality Using Liquid-Phase Deposited Nano-Patterned Sapphire Substrates
Author
Hsieh, Cheng-Yu ; Lin, Bo-Wen ; Cho, Hsin-Ju ; Wang, Bau-Ming ; Chang, Nancy ; Wu, Yew-Chung Sermon
Author_Institution
Materials Science and Engineering Department, National Chiao Tung University, Hsinchu, Taiwan
Volume
24
Issue
24
fYear
2012
Firstpage
2232
Lastpage
2234
Abstract
A relatively simple and easy and inexpensive liquid-phase deposition (LPD) method is employed to introduce nanoscale silica hemispheres on sapphire substrates for fabricating a nano-patterned sapphire substrate (NPSS). Compared with GaN grown on sapphire without any pattern, the NPSS-GaN film is of much better quality as observed by scanning electron microscopy, transmission electron-microscopy, X-ray diffraction, cathodoluminescence, and photoluminescence. This is because GaN is initiated from the c-plane instead of the LPD-silica surface. In addition, many dislocations within the NPSS-GaN bend toward the patterns, or end at the GaN/void interfaces.
Keywords
Films; Gallium nitride; Light emitting diodes; Nanopatterning; Nanoscale devices; Quantum wells; Substrates; Light-emitting diode (LED); nano pattern; sapphire;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2012.2224855
Filename
6330988
Link To Document