• DocumentCode
    1318417
  • Title

    Improvement of Epitaxy GaN Quality Using Liquid-Phase Deposited Nano-Patterned Sapphire Substrates

  • Author

    Hsieh, Cheng-Yu ; Lin, Bo-Wen ; Cho, Hsin-Ju ; Wang, Bau-Ming ; Chang, Nancy ; Wu, Yew-Chung Sermon

  • Author_Institution
    Materials Science and Engineering Department, National Chiao Tung University, Hsinchu, Taiwan
  • Volume
    24
  • Issue
    24
  • fYear
    2012
  • Firstpage
    2232
  • Lastpage
    2234
  • Abstract
    A relatively simple and easy and inexpensive liquid-phase deposition (LPD) method is employed to introduce nanoscale silica hemispheres on sapphire substrates for fabricating a nano-patterned sapphire substrate (NPSS). Compared with GaN grown on sapphire without any pattern, the NPSS-GaN film is of much better quality as observed by scanning electron microscopy, transmission electron-microscopy, X-ray diffraction, cathodoluminescence, and photoluminescence. This is because GaN is initiated from the c-plane instead of the LPD-silica surface. In addition, many dislocations within the NPSS-GaN bend toward the patterns, or end at the GaN/void interfaces.
  • Keywords
    Films; Gallium nitride; Light emitting diodes; Nanopatterning; Nanoscale devices; Quantum wells; Substrates; Light-emitting diode (LED); nano pattern; sapphire;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2012.2224855
  • Filename
    6330988