Title :
Quantitative analysis of optical reflection in a multimode interference 3 dB coupler using a low-coherence interferometric reflectometer
Author :
Shibata, Y. ; Oku, S. ; Yamamoto, M. ; Yoshimoto, N. ; Naganuma, M.
Author_Institution :
NTT Network Service Syst. Labs., Tokyo, Japan
fDate :
11/21/1996 12:00:00 AM
Abstract :
The quantitative reflection characteristics of multimode interference (MMI) couplers are investigated using a low-coherence interferometric reflectometer for the first time. MMI couplers are fabricated in an InP/InGaAsP/InP double-heterostructure, and the reflectivity from the interface between the MMI region and output waveguide is shown to be <-30 dB
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; integrated optoelectronics; light reflection; optical couplers; optical planar waveguides; III-V semiconductors; InP-InGaAs-InP; double-heterostructure devices; interferometric reflectometer; multimode interference 3 dB coupler; optical reflection; output waveguide; photonic integrated circuits; quantitative reflection characteristics; reflectivity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961486
