DocumentCode
1318716
Title
The Effect of Diode Response of Electromagnetic Field Probes for the Measurements of Complex Signals
Author
Nadakuduti, Jagadish ; Kühn, Sven ; Fehr, Marcel ; Douglas, Mark ; Pokovic, Katja ; Kuster, Niels
Author_Institution
Found. for Res. on Inf. Technol. in Soc. (IT´´IS Found.), Zurich, Switzerland
Volume
54
Issue
6
fYear
2012
Firstpage
1195
Lastpage
1204
Abstract
Diode detectors present inside electromagnetic field probes are typically calibrated for linearity using continuous sinusoidal waveforms (CW). In this paper, it is shown that CW linearization is not adequate for the measurement of complex wireless communication signals with high peak-to-average power ratios. While previous analog and digital communication signals (1G and 2G) can be more easily corrected for linearity, newer 3G and 4G communication protocols employ complex modulations with stochastic signal envelopes. As a result, proper linearization depends on the diode response and signal characteristics, and large errors results if CW linearization is used. The errors introduced when measuring such signals with probes employing CW linearization are quantified in this paper. A numerical model of the diode response is provided and validated against measurements. Errors due to CW linearization can exceed 2 dB, whereas linearity errors within 0.4 dB are attainable using the proposed calibration procedures for even increased dynamic ranges.
Keywords
3G mobile communication; 4G mobile communication; calibration; dosimetry; linearisation techniques; probes; protocols; 3G communication protocols; 4G communication protocols; CW linearization; complex modulations; complex wireless communication signals; continuous sinusoidal waveforms; diode detectors; diode response model; dynamic range; electromagnetic field probes; peak-to-average power ratio; stochastic signal envelopes; Calibration; Dosimetry; Measurement uncertainty; Numerical models; Probes; Specific absorption rate; Dosimetry; electromagnetic field probes; specific absorption rate;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2012.2201160
Filename
6331524
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