• DocumentCode
    1318857
  • Title

    Effects of material and/or structure on shielding of electronic devices

  • Author

    Mangeret, R. ; Carrière, T. ; Beaucour, J. ; Jordan, T.M.

  • Author_Institution
    Matra Marconi Space, Velizy Villacoublay, France
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2665
  • Lastpage
    2670
  • Abstract
    In this paper, we have pioneered a new direction concerning the shielding of electronic devices (at a microcircuit-packaging or a larger level) in a radiative environment. As a matter of fact, this work not only considers the role of the material itself on the shielding efficiency but also the effect of the structure of the shield. By simulations with the NOVICE Code, we have explored the possibility of combining the specific attenuation properties of given materials in an optimized multilayer (and multimaterial) structure. This study is based on a brief theoretical overview of interaction of space radiation with material. Then, the results of simulations are presented. The workframe of these calculations is a worst-case geosynchronous orbit (160° West) for a period of 15 years (trapped electrons and protons from 4 anomalously large solar particle events). We found that it is possible to improve the shielding properties of a monomaterial absorber by using an optimized multilayer, multimaterial shield
  • Keywords
    electron beam effects; integrated circuit packaging; proton effects; radiation protection; shielding; NOVICE code simulation; attenuation; electronic device; geosynchronous orbit; microcircuit packaging; multilayer multimaterial structure; shielding; solar particle events; space radiation; trapped electrons; trapped protons; Atomic measurements; Attenuation; Circuit simulation; Electron traps; Energy loss; Equations; Nonhomogeneous media; Orbital calculations; Protons; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556851
  • Filename
    556851