Title :
Single event upset at ground level
Author_Institution :
Boeing Defense & Space Group, Seattle, WA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam
Keywords :
DRAM chips; integrated circuit reliability; integrated circuit testing; neutron effects; DRAM chips; Weapons Neutron Research; atmospheric neutrons; computer systems; ground level; neutron beam; random access memory; single event upset; Aerospace electronics; Alpha particles; Biomedical measurements; Computer errors; Neutrons; Packaging; Particle beams; Random access memory; Read-write memory; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
