• DocumentCode
    1319021
  • Title

    Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model

  • Author

    Connell, L.W. ; Sexton, F.W. ; McDaniel, P.J. ; Prinja, A.K.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2814
  • Lastpage
    2819
  • Abstract
    Whereas HIC-UP modeled the heavy ion strike as a line source of charge, HIC-UP-TS accounts for the spatial distribution of electron-hole-pairs by using a 1/r2 profile. The model compares well with experimental data
  • Keywords
    integrated circuit modelling; ion beam effects; HIC-UP-TS model; electron-hole-pairs; heavy ion cross-section; single event upset; track structure; Azimuth; Contracts; Density functional theory; Equations; Geometry; Ion beams; Random variables; Single event upset; US Department of Energy; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556871
  • Filename
    556871
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1319021