Title :
Modeling the heavy ion cross-section for single event upset with track structure effects: the HIC-UP-TS model
Author :
Connell, L.W. ; Sexton, F.W. ; McDaniel, P.J. ; Prinja, A.K.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
Whereas HIC-UP modeled the heavy ion strike as a line source of charge, HIC-UP-TS accounts for the spatial distribution of electron-hole-pairs by using a 1/r2 profile. The model compares well with experimental data
Keywords :
integrated circuit modelling; ion beam effects; HIC-UP-TS model; electron-hole-pairs; heavy ion cross-section; single event upset; track structure; Azimuth; Contracts; Density functional theory; Equations; Geometry; Ion beams; Random variables; Single event upset; US Department of Energy; Weibull distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
