• DocumentCode
    1319036
  • Title

    Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies

  • Author

    Kollberg, Erik L. ; Yngvesson, K. Sigfrid ; Ren, Yuan ; Zhang, Wen ; Khosropanah, Pourya ; Gao, Jian-Rong

  • Author_Institution
    Dept. of Microtechnol. & Nano Sci., Chalmers Univ. of Technol., Gothenburg, Sweden
  • Volume
    1
  • Issue
    2
  • fYear
    2011
  • Firstpage
    383
  • Lastpage
    389
  • Abstract
    This paper discusses the current distribution in thin-film devices, especially in a hot-electron bolometer (HEB) mixer at terahertz frequencies, and the consequences of different current distributions on the device impedance. We first present an approximate analytical model from which we derive a proposed rule of thumb for deciding when the film is thin enough to support a current distribution that is uniform in the transverse direction. We then verify this rule by performing electromagnetic simulations. Our conclusion is that the current distribution in thin films with a relatively high DC resistivity and small film thickness with respect to the skin depth is essentially uniform up to 8 THz. These results are crucial, e.g., for understanding radiation coupling between an HEB and an antenna and indispensable when analyzing detectors and receivers based on bolometric properties of thin films.
  • Keywords
    bolometers; electromagnetic waves; hot carriers; mixers (circuits); thin film devices; DC resistivity; current distributions; device impedance; electromagnetic simulations; hot-electron bolometer mixers; radiation coupling; terahertz frequencies; thin film devices; transverse direction; Analytical models; Bolometers; Conductivity; Impedance; Mixers; Numerical simulation; Thin film devices; Electromagnetic simulations; hot-electron bolometers (HEBs); low-noise mixer receivers; terahertz; thin-film devices;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2011.2163550
  • Filename
    6017152