DocumentCode
1319036
Title
Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies
Author
Kollberg, Erik L. ; Yngvesson, K. Sigfrid ; Ren, Yuan ; Zhang, Wen ; Khosropanah, Pourya ; Gao, Jian-Rong
Author_Institution
Dept. of Microtechnol. & Nano Sci., Chalmers Univ. of Technol., Gothenburg, Sweden
Volume
1
Issue
2
fYear
2011
Firstpage
383
Lastpage
389
Abstract
This paper discusses the current distribution in thin-film devices, especially in a hot-electron bolometer (HEB) mixer at terahertz frequencies, and the consequences of different current distributions on the device impedance. We first present an approximate analytical model from which we derive a proposed rule of thumb for deciding when the film is thin enough to support a current distribution that is uniform in the transverse direction. We then verify this rule by performing electromagnetic simulations. Our conclusion is that the current distribution in thin films with a relatively high DC resistivity and small film thickness with respect to the skin depth is essentially uniform up to 8 THz. These results are crucial, e.g., for understanding radiation coupling between an HEB and an antenna and indispensable when analyzing detectors and receivers based on bolometric properties of thin films.
Keywords
bolometers; electromagnetic waves; hot carriers; mixers (circuits); thin film devices; DC resistivity; current distributions; device impedance; electromagnetic simulations; hot-electron bolometer mixers; radiation coupling; terahertz frequencies; thin film devices; transverse direction; Analytical models; Bolometers; Conductivity; Impedance; Mixers; Numerical simulation; Thin film devices; Electromagnetic simulations; hot-electron bolometers (HEBs); low-noise mixer receivers; terahertz; thin-film devices;
fLanguage
English
Journal_Title
Terahertz Science and Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-342X
Type
jour
DOI
10.1109/TTHZ.2011.2163550
Filename
6017152
Link To Document