DocumentCode :
1319036
Title :
Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies
Author :
Kollberg, Erik L. ; Yngvesson, K. Sigfrid ; Ren, Yuan ; Zhang, Wen ; Khosropanah, Pourya ; Gao, Jian-Rong
Author_Institution :
Dept. of Microtechnol. & Nano Sci., Chalmers Univ. of Technol., Gothenburg, Sweden
Volume :
1
Issue :
2
fYear :
2011
Firstpage :
383
Lastpage :
389
Abstract :
This paper discusses the current distribution in thin-film devices, especially in a hot-electron bolometer (HEB) mixer at terahertz frequencies, and the consequences of different current distributions on the device impedance. We first present an approximate analytical model from which we derive a proposed rule of thumb for deciding when the film is thin enough to support a current distribution that is uniform in the transverse direction. We then verify this rule by performing electromagnetic simulations. Our conclusion is that the current distribution in thin films with a relatively high DC resistivity and small film thickness with respect to the skin depth is essentially uniform up to 8 THz. These results are crucial, e.g., for understanding radiation coupling between an HEB and an antenna and indispensable when analyzing detectors and receivers based on bolometric properties of thin films.
Keywords :
bolometers; electromagnetic waves; hot carriers; mixers (circuits); thin film devices; DC resistivity; current distributions; device impedance; electromagnetic simulations; hot-electron bolometer mixers; radiation coupling; terahertz frequencies; thin film devices; transverse direction; Analytical models; Bolometers; Conductivity; Impedance; Mixers; Numerical simulation; Thin film devices; Electromagnetic simulations; hot-electron bolometers (HEBs); low-noise mixer receivers; terahertz; thin-film devices;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2011.2163550
Filename :
6017152
Link To Document :
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