Title :
An empirical model for predicting proton induced upset
Author :
Calvel, Philippe ; Barillot, Catherine ; Lamothe, Pierre ; Ecoffet, Robert ; Duzellier, Sophie ; Falguere, Didier
Author_Institution :
Alcatel Espace, Toulouse, France
fDate :
12/1/1996 12:00:00 AM
Abstract :
This paper presents an empirical model for proton induced Single Event Upset (SEU). This model is based on heavy ion data, and will improve the previous `two parameters´ Bendel model. Application to various parts is presented
Keywords :
integrated circuit modelling; proton effects; empirical PROFIT model; heavy ion data; proton induced SEU; single event upset; two parameter Bendel model; Electron traps; Equations; Mathematical model; Orbital calculations; Predictive models; Protons; Read-write memory; Single event upset; Surface fitting; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
