• DocumentCode
    1319042
  • Title

    Variation-Aware False Path Analysis Based on Statistical Dynamic Timing Analysis

  • Author

    Jung, Jongyoon ; Kim, Taewhan

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    31
  • Issue
    11
  • fYear
    2012
  • Firstpage
    1684
  • Lastpage
    1697
  • Abstract
    In recent years, there has been a lot of research into statistical static timing analysis (SSTA) to compute the critical path delay of a circuit under timing variation. In order to compute the true critical path delay, however, false paths that cannot be sensitized by any input vector must be identified first. Since SSTA is unable to capture the dynamic timing behavior of a circuit, it is completely blind to false paths, and thus it overestimates the circuit timing. In this paper, we propose a new concept of timing analysis approach called statistical dynamic timing analysis (SDTA), which is able to precisely express the statistical behavior of dynamic transitions at the output of gate into a compact form and to directly evaluate and propagate the expressions throughout the circuit, by which the false paths can be cleaned effectively. In addition, to be practical, we propose a couple of techniques that enable a fast computation of the SDTA. We tested the proposed approach on ISCAS benchmarks and carry skip adders under timing variation to show its accuracy in computing the distribution of the true critical path delay of a circuit. In summary, compared to the previous approach of false path-aware statistical timing analysis, our timing analysis technique is able to reduce the accuracy error in the mean and standard deviation of true critical path delay distribution from 9.8% to 1.9% and from 29.4% to -3.4%, respectively.
  • Keywords
    adders; carry logic; critical path analysis; integrated circuit testing; logic testing; statistical analysis; timing circuits; SDTA; SSTA; carry skip adder; circuit timing variation; critical path delay distribution; dynamic timing behavior; dynamic transition; false path-aware statistical timing analysis; mean deviation; standard deviation; statistical behavior; statistical dynamic timing analysis; statistical static timing analysis; variation-aware false path analysis; Computational modeling; Delay; Integrated circuit modeling; Logic gates; Vectors; Zirconium; Dynamic timing analysis; false path identification; process variation; statistical static timing analysis (SSTA);
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2012.2202392
  • Filename
    6331645