• DocumentCode
    1319270
  • Title

    Heavy ion and proton induced single event transients in comparators

  • Author

    Nichols, Donald K. ; Coss, James R. ; Miyahira, Tetsuo F. ; Schwartz, Harvey R.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2960
  • Lastpage
    2967
  • Abstract
    This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.)
  • Keywords
    analogue integrated circuits; comparators (circuits); ion beam effects; proton effects; transient response; comparators; extended pulse duration; heavy ion induced transients; high voltage amplitude; linear ICs; low LET threshold; proton induced transients; single event transients; Capacitors; Circuit testing; Cyclotrons; Displays; Laboratories; Propulsion; Protons; Satellites; Threshold voltage; Transient response;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556892
  • Filename
    556892
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1319270