Title :
Comments on "Reliability and Comparative Analysis of Two Standby System Configurations
Author_Institution :
Lockheed Missiles and Space Company, Inc., Sunnyvale, Calif., 94088.
fDate :
4/1/1974 12:00:00 AM
Keywords :
Books; Control charts; Exponential distribution; Industrial control; Quality control; Reliability; Sampling methods;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215711
