• DocumentCode
    1319782
  • Title

    Low-Voltage Junctionless Oxide-Based Thin-Film Transistors Self-Assembled by a Gradient Shadow Mask

  • Author

    Wu, Guodong ; Zhou, Jumei ; Zhang, Hongliang ; Zhu, Liqiang ; Wan, Qing

  • Author_Institution
    Ningbo Inst. of Mater. Technol. & Eng., Ningbo, China
  • Volume
    33
  • Issue
    12
  • fYear
    2012
  • Firstpage
    1720
  • Lastpage
    1722
  • Abstract
    A gradient shadow-mask diffraction method is proposed for the fabrication of junctionless indium-tin-oxide (ITO) and indium-zinc-oxide (IZO) thin-film transistors (TFTs) with different channel thicknesses on one glass substrate during one-batch radio-frequency magnetron sputtering. The operation mode and saturation field-effect mobility of the room-temperature-processed oxide-based junctionless TFTs are channel thickness dependent, and the threshold voltages shift from negative to positive when the self-assembled channel thickness is reduced to a critical thickness.
  • Keywords
    II-VI semiconductors; indium compounds; masks; self-assembly; sputter deposition; thin film transistors; wide band gap semiconductors; ITO; InZnO; channel thickness; glass substrate; gradient shadow mask diffraction method; junctionless indium tin oxide thin film transistor; juntionless indium zinc oxide thin film transistor; low-voltage junctionless oxide-based thin-film transistor; one batch radiofrequency magnetron sputtering; room-temperature-processed oxide-based junctionless TFT; saturation field effect mobility; self-assembled channel thickness; Capacitance; Indium tin oxide; Sputtering; Substrates; Thin film transistors; Threshold voltage; Gradient mask diffraction; junctionless thin-film transistors (TFTs); operation mode modulation;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2217934
  • Filename
    6332473