Title :
Explicit Drain-Current Model of Graphene Field-Effect Transistors Targeting Analog and Radio-Frequency Applications
Author :
Jiménez, David ; Moldovan, Oana
Author_Institution :
Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
Abstract :
We present a compact physics-based model of the current-voltage characteristics of graphene field-effect transistors, of especial interest for analog and RF applications where band-gap engineering of graphene could be not needed. The physical framework is a field-effect model and drift-diffusion carrier transport. Explicit closed-form expressions have been derived for the drain current continuously covering all operation regions. The model has been benchmarked with measured prototype devices, demonstrating accuracy and predictive behavior. Finally, we show an example of projection of the intrinsic gain as a figure of merit commonly used in RF/analog applications.
Keywords :
field effect transistors; graphene; C; band-gap engineering; current-voltage characteristics; drain current; drift diffusion carrier transport; explicit drain-current model; field-effect model; graphene field-effect transistors; intrinsic gain; physics-based model; Dielectrics; Logic gates; Quantum capacitance; Radio frequency; Silicon; Transistors; Analog; field-effect transistor (FET); graphene; modeling; radio frequency (RF);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2163517