DocumentCode :
1320174
Title :
Cryogenic random-access memories
Author :
Sass, A.R. ; Stewart, W.C. ; Cosentino, L.S.
Author_Institution :
RCA Laboratories
Volume :
4
Issue :
7
fYear :
1967
fDate :
7/1/1967 12:00:00 AM
Firstpage :
91
Lastpage :
98
Abstract :
Three-wire cryoelectric memory cells and the hybrid AB system organization that utilizes coincident-current selection are examined from the standpoint of batch fabrication requirements, redundancy, electrical parameters, tolerances, and noise immunity. These advances, demonstrated with experimental sub-systems, are described in relation to previous work, and are shown to place cryoelectrics as a strong contender for achieving systems with capacities of more than 108 bits.
Keywords :
Computer displays; Cost function; Cryogenics; Electric resistance; Fabrication; Laboratories; Refrigeration; Superconducting thin films; Switches; Thin film devices;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1967.5215859
Filename :
5215859
Link To Document :
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