Determination of Bit Patterned Media Noise Based on Island Perimeter Fluctuations

We measured the fluctuation in shape of magnetic islands in bit patterned media fabricated by laser interference lithography. This fluctuation can be accurately described by a model based on a Fourier series expansion of the perimeter of the islands. The model can be easily linked to amplitude and jitter noise. We show that the amplitude and jitter noise are in principle correlated, and the jitter noise increases with increasing island area. The correlation is small for media prepared by laser interference lithography, but expected to gain importance for high density bit patterned media.