Multilayer Debugging Process (A New Method of Screening)

In general, a small proportion of components will be substandard because of some imperfection in the control of the production process. Because no advance knowledge exists as to which are the substandard components, their presence affects the reliability. A great part of the substandard components can be eliminated by means of debugging procedures, but due to a nonzero proportion of defectives of the component population, it is impossible to eliminate all of the substandard components through conventional debugging processes. To remedy this drawback, this paper presents a new debugging process that is capable of eliminating almost all of the substandard components. From an analysis and comparison of the new debugging process with the conventional method, it has become evident that we can reduce the fraction defective of the lot after debugging by several orders of magnitude when compared with the conventional method.