Title :
Frequency-domain measurement of phase error distribution in narrow-channel arrayed waveguide grating
Author :
Takada, K. ; Okamoto, K.
Author_Institution :
Nippon Telegraph & Telephone Corp., NTT Photonics Labs, Ibaraki, Japan
fDate :
1/20/2000 12:00:00 AM
Abstract :
The authors report a method for measuring the phase error of an arrayed-waveguide grating (AWG) in the frequency domain, using an interferometer with a continuously tuned laser. An interferogram of the AWG, obtained using the optical low coherence method, is derived numerically as a function of the optical delay. Since any large optical delay value is given in the calculation, the new method is suited to an AWG with a longer step increment or a channel spacing of 1 to 10 GHz. The phase error distribution of an AWG with 10 GHz channel spacing is successfully measured
Keywords :
diffraction gratings; light interferometry; optical arrays; optical communication equipment; optical waveguide components; arrayed waveguide grating; frequency domain measurement; light interferometry; optical delay; optical low coherence method; phase error distribution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000156