DocumentCode
1320822
Title
Frequency-domain measurement of phase error distribution in narrow-channel arrayed waveguide grating
Author
Takada, K. ; Okamoto, K.
Author_Institution
Nippon Telegraph & Telephone Corp., NTT Photonics Labs, Ibaraki, Japan
Volume
36
Issue
2
fYear
2000
fDate
1/20/2000 12:00:00 AM
Firstpage
160
Lastpage
161
Abstract
The authors report a method for measuring the phase error of an arrayed-waveguide grating (AWG) in the frequency domain, using an interferometer with a continuously tuned laser. An interferogram of the AWG, obtained using the optical low coherence method, is derived numerically as a function of the optical delay. Since any large optical delay value is given in the calculation, the new method is suited to an AWG with a longer step increment or a channel spacing of 1 to 10 GHz. The phase error distribution of an AWG with 10 GHz channel spacing is successfully measured
Keywords
diffraction gratings; light interferometry; optical arrays; optical communication equipment; optical waveguide components; arrayed waveguide grating; frequency domain measurement; light interferometry; optical delay; optical low coherence method; phase error distribution;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20000156
Filename
833160
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