DocumentCode
1320833
Title
Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-Optical Kerr Effect Spectroscopy
Author
Fronk, Michael ; Schubert, Christian ; Haidu, Francisc ; Scarlat, Camelia ; Dörr, Kathrin ; Albrecht, Manfred ; Zahn, Dietrich R T ; Salvan, Georgeta
Author_Institution
Inst. of Phys., Chemnitz Univ. of Technol., Chemnitz, Germany
Volume
48
Issue
11
fYear
2012
Firstpage
2777
Lastpage
2780
Abstract
We report the characterization of metal-phthalocyanine (CuPc and CoPc) thin films prepared on magnetic substrates by spectroscopic ellipsometry (SE) and magneto-optical Kerr effect (MOKE) spectroscopy. CuPc films were prepared on lanthanum strontium manganite (LSMO) substrates while CoPc was deposited onto Co/Pt layer systems. We address the challenge to distinguish between the dominating magneto-optical response of the magnetic substrate and the contribution of the phthalocyanine layers. The procedure is demonstrated for CuPc on LSMO and also applied to CoPc on Co/Pt. The resulting spectral contribution of the organic films is compared to modeled spectra deduced from optical model calculations based on data previously obtained from phthalocyanines on silicon substrates. For CoPc on Co/Pt the average tilt angle of the molecular plane with respect to the substrate plane is estimated to be 73 ° from the ellipsometry data evaluation.
Keywords
Kerr magneto-optical effect; cobalt alloys; cobalt compounds; copper compounds; ellipsometry; ferromagnetic materials; lanthanum compounds; magnetic thin films; platinum alloys; silicon; strontium compounds; Co-Pt; Co/Pt layer systems; CoPc thin films; CuPc thin films; La1-xSrxMnO3; Si; ferromagnetic substrates; lanthanum strontium manganite substrates; magneto-optical Kerr effect spectroscopy; metal-phthalocyanine; molecular plane; organic thin films; phthalocyanine layers; silicon substrates; spectroscopic ellipsometry; Ellipsometry; Magnetic separation; Magnetooptic effects; Optical saturation; Saturation magnetization; Silicon; Substrates; Ellipsometry; magnetic films; magneto-optic effects; organic semiconductors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2012.2203109
Filename
6332697
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