• DocumentCode
    1320833
  • Title

    Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-Optical Kerr Effect Spectroscopy

  • Author

    Fronk, Michael ; Schubert, Christian ; Haidu, Francisc ; Scarlat, Camelia ; Dörr, Kathrin ; Albrecht, Manfred ; Zahn, Dietrich R T ; Salvan, Georgeta

  • Author_Institution
    Inst. of Phys., Chemnitz Univ. of Technol., Chemnitz, Germany
  • Volume
    48
  • Issue
    11
  • fYear
    2012
  • Firstpage
    2777
  • Lastpage
    2780
  • Abstract
    We report the characterization of metal-phthalocyanine (CuPc and CoPc) thin films prepared on magnetic substrates by spectroscopic ellipsometry (SE) and magneto-optical Kerr effect (MOKE) spectroscopy. CuPc films were prepared on lanthanum strontium manganite (LSMO) substrates while CoPc was deposited onto Co/Pt layer systems. We address the challenge to distinguish between the dominating magneto-optical response of the magnetic substrate and the contribution of the phthalocyanine layers. The procedure is demonstrated for CuPc on LSMO and also applied to CoPc on Co/Pt. The resulting spectral contribution of the organic films is compared to modeled spectra deduced from optical model calculations based on data previously obtained from phthalocyanines on silicon substrates. For CoPc on Co/Pt the average tilt angle of the molecular plane with respect to the substrate plane is estimated to be 73 ° from the ellipsometry data evaluation.
  • Keywords
    Kerr magneto-optical effect; cobalt alloys; cobalt compounds; copper compounds; ellipsometry; ferromagnetic materials; lanthanum compounds; magnetic thin films; platinum alloys; silicon; strontium compounds; Co-Pt; Co/Pt layer systems; CoPc thin films; CuPc thin films; La1-xSrxMnO3; Si; ferromagnetic substrates; lanthanum strontium manganite substrates; magneto-optical Kerr effect spectroscopy; metal-phthalocyanine; molecular plane; organic thin films; phthalocyanine layers; silicon substrates; spectroscopic ellipsometry; Ellipsometry; Magnetic separation; Magnetooptic effects; Optical saturation; Saturation magnetization; Silicon; Substrates; Ellipsometry; magnetic films; magneto-optic effects; organic semiconductors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2012.2203109
  • Filename
    6332697