DocumentCode :
1320927
Title :
Radio Frequency Magnetic Near Field Measurements of Coplanar Waveguide Simulated Power and Ground Lines in Radio Frequency Integrated Circuits Using a MFM Tip
Author :
Endo, Yasushi ; Fukushima, Masaaki ; Arai, Kaoru ; Shimada, Yutaka ; Yamaguchi, Masahiro
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Volume :
48
Issue :
11
fYear :
2012
Firstpage :
3666
Lastpage :
3669
Abstract :
This paper describes our study on high-resolution measurements of the distribution of the radio frequency (RF) magnetic near field from a coplanar waveguide (CPW) with a size similar to power and ground lines in radio frequency integrated circuit chips using a magnetic force microscope tip and amplitude modulation of the line current. Cantilever resonance frequency modulation of approximately 25 kHz supplies the CPW with current and carrier frequencies up to 0.1 GHz. The CPW has a signal line width of 3 μm and a ground line width of 50 μm. The oscillation amplitudes of the tip with and without a DC magnetic field indicates that the distribution of the RF magnetic near field in the proximity of the CPW can be observed for a carrier frequency up to 0.1 GHz. This result also suggests that this method has potential as a new technique for high-resolution RF field measurements.
Keywords :
amplitude modulation; cantilevers; coplanar waveguides; magnetic force microscopy; radiofrequency integrated circuits; radiofrequency measurement; MFM tip; RF field measurement; RF magnetic near field; amplitude modulation; cantilever resonance frequency modulation; coplanar waveguide; ground line; high-resolution measurement; magnetic force microscope tip; radio frequency integrated circuit chip; radio frequency magnetic near field distribution; radio frequency magnetic near field measurement; size 3 mum; size 50 mum; Coplanar waveguides; Frequency measurement; Frequency modulation; Magnetic resonance; Magnetic separation; Radio frequency; Amplitude modulation; RF magnetic near field; coplanar waveguide (CPW); magnetic force microscope (MFM);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2012.2204968
Filename :
6332711
Link To Document :
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