Title :
Intergranular Exchange Coupling in FePt:X:FePt (
, C,
,
Author :
Granz, Steven D. ; Kryder, Mark H.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
In this study we quantitatively determined the exchange coupling across B, C, SiOx, Cr and TaOx segregants by measuring the exchange coupling between two FePt layers separated by segregant layers of varying thickness. Our study indicates that the segregant that provides the best exchange break is TaOx; whereas, C is the worst and SiOx, Cr and B are in between. Our data indicates that a segregant intergranular region thicker than 0.8 nm should decouple FePt grains if B, TaOx, SiOx, or Cr are used, but with C, a thickness greater than 1 nm is required.
Keywords :
boron; carbon; chromium; exchange interactions (electron); iron alloys; magnetic thin films; metallic thin films; perpendicular magnetic recording; platinum alloys; silicon compounds; tantalum compounds; FePt grains; FePt layers; FePt-Al-FePt; FePt-C-FePt; FePt-Cr-FePt; FePt-SiOx-FePt; FePt-TaOx-FePt; exchange break; heat assisted magnetic recording; intergranular exchange coupling; segregant intergranular region; segregant layers; thin films; Couplings; Magnetic hysteresis; Magnetic recording; Media; Perpendicular magnetic anisotropy; Saturation magnetization; FePt; HAMR; L10 media; intergranular exchange coupling; perpendicular media;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2194698