• DocumentCode
    1320978
  • Title

    Intergranular Exchange Coupling in FePt:X:FePt ( {\\rm X}={\\rm B} , C, {\\rm SiO}_{\\rm x} ,

  • Author

    Granz, Steven D. ; Kryder, Mark H.

  • Author_Institution
    Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    48
  • Issue
    11
  • fYear
    2012
  • Firstpage
    2746
  • Lastpage
    2748
  • Abstract
    In this study we quantitatively determined the exchange coupling across B, C, SiOx, Cr and TaOx segregants by measuring the exchange coupling between two FePt layers separated by segregant layers of varying thickness. Our study indicates that the segregant that provides the best exchange break is TaOx; whereas, C is the worst and SiOx, Cr and B are in between. Our data indicates that a segregant intergranular region thicker than 0.8 nm should decouple FePt grains if B, TaOx, SiOx, or Cr are used, but with C, a thickness greater than 1 nm is required.
  • Keywords
    boron; carbon; chromium; exchange interactions (electron); iron alloys; magnetic thin films; metallic thin films; perpendicular magnetic recording; platinum alloys; silicon compounds; tantalum compounds; FePt grains; FePt layers; FePt-Al-FePt; FePt-C-FePt; FePt-Cr-FePt; FePt-SiOx-FePt; FePt-TaOx-FePt; exchange break; heat assisted magnetic recording; intergranular exchange coupling; segregant intergranular region; segregant layers; thin films; Couplings; Magnetic hysteresis; Magnetic recording; Media; Perpendicular magnetic anisotropy; Saturation magnetization; FePt; HAMR; L10 media; intergranular exchange coupling; perpendicular media;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2012.2194698
  • Filename
    6332720