On n-detection test sets and variable n-detection test sets for transition faults

Author

Pomeranz, Irith ; Reddy, Sudhakar M.

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

Volume

19

Issue

3

fYear

2000

fDate

3/1/2000 12:00:00 AM

Firstpage

372

Lastpage

383

Abstract

We study the effectiveness of n-detection test sets based on transition faults in detecting defects that affect the timing behavior of a circuit. We use path delay faults as surrogates for unmodeled defects, and show that the path delay fault coverage achieved by an n-detection transition fault test set increases significantly as n is increased. We also introduce a method to reduce the number of tests included in an n-detection test set by using different values of n for different faults based on their potential effect on the defect coverage. The resulting test sets are referred to as variable n-detection test sets

Keywords

automatic test pattern generation; integrated circuit testing; logic testing; timing; ATPG; defects detection; delay fault coverage; n-detection test sets; path delay faults; timing behavior; transition faults; variable n-detection test sets; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Delay; Electrical fault detection; Fault detection; Logic circuits; Timing; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.833205

Filename

833205